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Fundamentals of atomic force microscopy :

Reifenberger, Ronald

Fundamentals of atomic force microscopy : Part I : foundations / Ronald Reifenberger - Singapore World Scientific 2016 - 324 p. - Lessons from nanoscience: a lecture note series ; volume 4 .

Includes bibliographical references and index.

Part 1. Foundations

ISBN: 9789814630344 (v. 1 : hardcover : alk. paper) 9814630349 (v. 1 : hardcover : alk. paper) 9789814630351 (v. 1 : softcover : alk. paper) 9814630357 (v. 1 : softcover : alk. paper)

LCCN: 2014029164

Subjects--Topical Terms:
Atomic force microscopy.

LC Class. No.: QH212.A78 / R45 2016

Dewey Class. No.: 502.82 REI-R

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