Data-driven methods for faulty detection and diagnosis in chemical processes / Evan Russell, Leo H. Chiang and Richard D. Braatz

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Material type: Text

TextPublication details: Houston Springer 2000Description: 192 pISBN:

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Holdings
Item type	Current library	Collection	Shelving location	Call number	Copy number	Status	Date due	Barcode	Item holds
Text Book	BITS Pilani Hyderabad	660	Text & Reference Section (Student cannot borrow these books)	660.2815 RUS-E (Browse shelf(Opens below))	INR 9349.07	Available		48858

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