VLSI test principles and architectures : design for testability ed. by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen

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Material type: Text

TextLanguage: ENG Publication details: Amsterdam Elsevier Morgan Kaufmann Publishers 2006Description: 777 pISBN:

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Holdings
Item type	Current library	Collection	Shelving location	Call number	Status	Date due	Barcode	Item holds
Books	BITS Pilani Hyderabad	621	General Stack (For lending)	621.395 WAN-L (Browse shelf(Opens below))	Available		15014
Books	BITS Pilani Hyderabad	621	General Stack (For lending)	621.395 WAN-L (Browse shelf(Opens below))	Available		9488

Total holds: 0

The Morgan Kaufmann series in systems on silicon

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