Fundamentals of atomic force microscopy : Part I : foundations / Ronald Reifenberger

By: Material type: TextTextSeries: Lessons from nanoscience: a lecture note series ; volume 4Publication details: Singapore World Scientific 2016Description: 324 pISBN:
  • 9789814630344 (v. 1 : hardcover : alk. paper)
  • 9814630349 (v. 1 : hardcover : alk. paper)
  • 9789814630351 (v. 1 : softcover : alk. paper)
  • 9814630357 (v. 1 : softcover : alk. paper)
Subject(s): DDC classification:
  • 502.82 REI-R 23
LOC classification:
  • QH212.A78 R45 2016
Incomplete contents:
Part 1. Foundations
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Holdings
Item type Current library Collection Shelving location Call number Status Date due Barcode Item holds
Books Books BITS Pilani Hyderabad 500 General Stack (For lending) 502.82 REI-R (Browse shelf(Opens below)) Available 28396
Total holds: 0

Includes bibliographical references and index.

Part 1. Foundations

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